Sealed source applications

Simple item page
dc.contributor.authorWickramanayake, D.G.L.
dc.date.accessioned2021-07-01T04:01:58Z
dc.date.available2021-07-01T04:01:58Z
dc.date.issued1993
dc.identifier.citationSeminar on Non-Destructive Testing Quality Control and Quality Assurance in Industry:p.1-25
dc.identifier.urihttps://dl-iesl.nsf.gov.lk/handle/1/3488
dc.publisherThe Institution of Engineers:Colombo
dc.titleSealed source applications
dc.typeConference Paper

Files

Collections

Proceedings